Method of forming metal lines and bumps for semiconductor...

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

Reexamination Certificate

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Details

C438S614000, C438S669000, C438S687000

Reexamination Certificate

active

07855144

ABSTRACT:
Provided is a method of forming conductors (e.g., metal lines and/or bumps) for semiconductor devices and conductors formed from the same. First and second seed metal layers may be formed. At least one mask may be formed on a portion on which a conductor is to be formed. An exposed portion may be oxidized. The oxidized portion may be removed. A conductive structure may be formed on an upper surface of a portion which is not oxidized. The conductors may be metal lines and/or bumps. The conductive structures may be solder balls.

REFERENCES:
patent: 5486282 (1996-01-01), Datta et al.
patent: 5705857 (1998-01-01), Farooq et al.
patent: 2003/0146520 (2003-08-01), Fang
patent: 2005-038979 (2005-02-01), None
patent: 10-2005-0028377 (2005-03-01), None
patent: 1020060007531 (2006-01-01), None
patent: 1020060007846 (2006-01-01), None
Korean Office Action dated Jun. 20, 2007.

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