Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2007-08-30
2010-10-12
Ton, David (Department: 2117)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
C714S718000
Reexamination Certificate
active
07814385
ABSTRACT:
A built-in self-test (BIST) device tests multiple embedded memories of different characteristics. The BIST includes a BIST controller, a delay generator, multiple interface modules, and a memory wrapper. The BIST controller generates an initialization sequence and a memory test algorithm. The delay generator provides a delay of an expected data, a valid signal, a BBAD signal, a BEND signal, and a BFAIL signal. The multiple interface modules provide signal pipelining for multiple memories through a bus. The bus carries signals form the BIST device to multiple memories and vice-versa. The memory wrapper decodes a selected memory for decompressing a memory data signal generated by said BIST device and further compresses a memory output signal.
REFERENCES:
patent: 4903266 (1990-02-01), Hack
patent: 5535164 (1996-07-01), Adams et al.
patent: 5606567 (1997-02-01), Agrawal et al.
patent: 5617531 (1997-04-01), Crouch et al.
patent: 5796993 (1998-08-01), Maguire
patent: 6321320 (2001-11-01), Fleischman et al.
patent: 6760865 (2004-07-01), Ledford et al.
patent: 7168005 (2007-01-01), Adams et al.
patent: 7313739 (2007-12-01), Menon et al.
patent: 2008/0104466 (2008-05-01), Menon et al.
patent: 2008/0126892 (2008-05-01), Dubey et al.
Baunach Jeremiah J.
Jorgenson Lisa K.
Seed IP Law Group PLLC
STMicroelectronics Pvt. Ltd.
Ton David
LandOfFree
Self programmable shared bist for testing multiple memories does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Self programmable shared bist for testing multiple memories, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Self programmable shared bist for testing multiple memories will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4214603