Flash memory device with word lines of uniform width and...

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

Reexamination Certificate

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Reexamination Certificate

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07820547

ABSTRACT:
A method for manufacturing a semiconductor device, the method including: forming a bit line in a semiconductor substrate; forming a plurality of word lines which intersect with the bit line at predetermined intervals on the semiconductor substrate; eliminating a portion of the plurality of word lines; forming an interlayer insulating film on the semiconductor substrate; and forming a metal plug which penetrates through the interlayer insulating film and is coupled to the bit line in a region where the portion of the plurality of word lines was eliminated.

REFERENCES:
patent: 5786273 (1998-07-01), Hibi et al.
patent: 6403431 (2002-06-01), Chung et al.
patent: 6544883 (2003-04-01), Ohuchi
patent: 6864173 (2005-03-01), Kim
patent: 2002/0022360 (2002-02-01), Kim et al.
patent: 2003/0040152 (2003-02-01), Liu et al.
patent: 2007013155 (2007-01-01), None

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