Semiconductor integrated circuit device and inspection...

Details Semiconductor integrated circuit device and inspection... Semiconductor integrated circuit device and inspection...

2007-02-09

2010-11-30

Ton, David (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C324S765010

Reexamination Certificate

active

07844874

ABSTRACT:
A semiconductor integrated circuit device includes: a plurality of devices under test formed on a substrate; a selection circuit formed on the substrate which selects two of the plurality of devices under test; a magnitude comparison circuit formed on the substrate which measures an electrical characteristic of the two selected devices under test and makes a magnitude comparison between values of the measured electrical characteristic; an address memory circuit formed on the substrate which stores addresses of the two devices under test between which the magnitude comparison has been made; and a control circuit formed on the substrate and connected to the selection circuit, the magnitude comparison circuit, and the address memory circuit.

REFERENCES:
patent: 6429677 (2002-08-01), Montrose
patent: 6559673 (2003-05-01), Neeb
patent: 7116114 (2006-10-01), Kajita
patent: 7446553 (2008-11-01), Cano et al.
patent: 2003-7785 (2003-01-01), None

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