Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2009-10-08
2010-11-02
Ton, David (Department: 2117)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
C714S729000
Reexamination Certificate
active
07827453
ABSTRACT:
An integrated circuit carries an intellectual property core. The intellectual property core includes a test access port39with test data input leads15, test data output leads13, control leads17and an external register present, ERP lead37. A scan register25encompasses the intellectual property core and ERP lead37carries a signal indicating the presence of the scan register.
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Bassuk Lawrence J.
Brady W. James
Telecky , Jr. Frederick J.
Texas Instruments Incorporated
Ton David
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