Method of forming a layer comprising epitaxial silicon

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C257SE21104, C257SE21132, C257SE21410

Reexamination Certificate

active

07439136

ABSTRACT:
The invention includes methods of forming epitaxial silicon-comprising material and methods of forming vertical transistors. In one implementation, a method of forming epitaxial silicon-comprising material includes providing a substrate comprising monocrystalline material. A first portion of the monocrystalline material is outwardly exposed while a second portion of the monocrystalline material is masked. A first silicon-comprising layer is epitaxially grown from the exposed monocrystalline material of the first portion and not from the monocrystalline material of the masked second portion. After growing the first silicon-comprising layer, the second portion of the monocrystalline material is unmasked. A second silicon-comprising layer is then epitaxially grown from the first silicon-comprising layer and from the unmasked monocrystalline material of the second portion. Other aspects and implementations are contemplated.

REFERENCES:
patent: 4526631 (1985-07-01), Silvestri et al.
patent: 4528047 (1985-07-01), Beyer et al.
patent: 4758531 (1988-07-01), Beyer et al.
patent: 4847210 (1989-07-01), Hwang et al.
patent: 5039625 (1991-08-01), Reisman et al.
patent: 5073516 (1991-12-01), Moslehi
patent: 5248385 (1993-09-01), Powell
patent: 5250837 (1993-10-01), Sparks
patent: 5340754 (1994-08-01), Witek et al.
patent: 5599724 (1997-02-01), Yoshida
patent: 5753555 (1998-05-01), Hada
patent: 5763305 (1998-06-01), Chao
patent: 6060746 (2000-05-01), Bertin et al.
patent: 6064081 (2000-05-01), Robinson et al.
patent: 6156620 (2000-12-01), Puchner et al.
patent: 6204532 (2001-03-01), Gambino et al.
patent: 6297531 (2001-10-01), Armacost et al.
patent: 6406962 (2002-06-01), Agnello et al.
patent: 6436770 (2002-08-01), Leung et al.
patent: 6437375 (2002-08-01), Beaman
patent: 6448129 (2002-09-01), Cho et al.
patent: 6492216 (2002-12-01), Yeo et al.
patent: 6506638 (2003-01-01), Yu
patent: 6518609 (2003-02-01), Ramesh
patent: 6605498 (2003-08-01), Murthy et al.
patent: 6617226 (2003-09-01), Suguro et al.
patent: 6624032 (2003-09-01), Alavi et al.
patent: 6642539 (2003-11-01), Ramesh et al.
patent: 6670689 (2003-12-01), Oh et al.
patent: 6703290 (2004-03-01), Boydston et al.
patent: 6713378 (2004-03-01), Drynan
patent: 6716687 (2004-04-01), Wang et al.
patent: 6716719 (2004-04-01), Clampitt et al.
patent: 6734082 (2004-05-01), Zheng et al.
patent: 6746923 (2004-06-01), Skotnicki et al.
patent: 6790713 (2004-09-01), Horch
patent: 6805962 (2004-10-01), Bedell et al.
patent: 6855436 (2005-02-01), Bedell et al.
patent: 6858499 (2005-02-01), Bol
patent: 6860944 (2005-03-01), Ivanov et al.
patent: 6878592 (2005-04-01), Besser et al.
patent: 6885069 (2005-04-01), Ohguro
patent: 6946377 (2005-09-01), Chambers
patent: 2001/0010962 (2001-08-01), Chen et al.
patent: 2001/0017392 (2001-08-01), Comfort et al.
patent: 2001/0025985 (2001-10-01), Noble
patent: 2001/0041438 (2001-11-01), Maeda et al.
patent: 2002/0081861 (2002-06-01), Robinson et al.
patent: 2003/0027406 (2003-02-01), Malone
patent: 2003/0153155 (2003-08-01), Wang et al.
patent: 2003/0194496 (2003-10-01), Xu et al.
patent: 2003/0211712 (2003-11-01), Chen et al.
patent: 2003/0234414 (2003-12-01), Brown
patent: 2004/0121546 (2004-06-01), Yoo
patent: 2004/0241460 (2004-12-01), Bedell et al.
patent: 2005/0224800 (2005-10-01), Lindert et al.
patent: 2006/0046391 (2006-03-01), Tang et al.
patent: 2006/0046440 (2006-03-01), Ramaswami et al.
patent: 2006/0046442 (2006-03-01), Ramaswami et al.
patent: 2006/0046459 (2006-03-01), Ramaswami et al.
patent: 2006/0051941 (2006-03-01), Blomiley et al.
patent: 2006/0081884 (2006-04-01), Abbott et al.
patent: 2006/0126044 (2006-06-01), Haller
patent: 2006/0264010 (2006-11-01), Ramaswamy et al.
Bashir et al.,Characterization and modeling of sidewall defects in selective epitaxial growth of silicon, J. Vac. Sci. Technol. B, vol. 13, Part 3, pp. 928-935 (May/Jun. 1995).

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method of forming a layer comprising epitaxial silicon does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of forming a layer comprising epitaxial silicon, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of forming a layer comprising epitaxial silicon will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4018309

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.