Semiconductor module with a configuration for the self-test...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Details

C714S733000, C714S734000, C714S738000

Reexamination Certificate

active

10075656

ABSTRACT:
A semiconductor module with a plurality of interface circuits has a configuration for the self-test of interface circuits, with two equally sized groups of interface circuits such that each interface circuit of the first group is assigned exactly one interface circuit of the second group. A circuit interacts with the first group and serves for generating test signals which can be output via the interface circuits of the first group. Another circuit interacts with the second group and serves for receiving and processing test signals received via the interface circuits of the second group, so that a connection of the assigned interface circuits of the first and second groups enables a self-test, the first and second groups of interface circuits having a separate voltage supply. This enables good test coverage by separate variation of the voltage of transmitting and receiving group.

REFERENCES:
patent: 5751151 (1998-05-01), Levy et al.
patent: 6477674 (2002-11-01), Bates et al.
patent: 6704897 (2004-03-01), Takagi
patent: 2003/0101376 (2003-05-01), Sanghani
patent: 2003/0120989 (2003-06-01), Zumkehr
patent: 198 32 307 (2000-02-01), None
patent: 199 01 460 (2000-08-01), None

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