Methods of selective deposition of heavily doped epitaxial SiGe

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S503000, C438S481000, C438S300000

Reexamination Certificate

active

10683937

ABSTRACT:
The invention generally teaches a method for depositing a silicon film or silicon germanium film on a substrate comprising placing the substrate within a process chamber and heating the substrate surface to a temperature in the range from about 600° C. to about 900° C. while maintaining a pressure in the range from about 0.1 Torr to about 200 Torr. A deposition gas is provided to the process chamber and includes SiH4, an optional germanium source gas, an etchant, a carrier gas and optionally at least one dopant gas. The silicon film or the silicon germanium film is selectively and epitaxially grown on the substrate. One embodiment teaches a method for depositing a silicon-containing film with an inert gas as the carrier gas. Methods may include the fabrication of electronic devices utilizing selective silicon germanium epitaxial films.

REFERENCES:
patent: 4834831 (1989-05-01), Nishizawa et al.
patent: 5112439 (1992-05-01), Reisman et al.
patent: 5273930 (1993-12-01), Steele et al.
patent: 5294286 (1994-03-01), Nishizawa et al.
patent: 5372860 (1994-12-01), Fehlner et al.
patent: 5374570 (1994-12-01), Nasu et al.
patent: 5469806 (1995-11-01), Mochizuki et al.
patent: 5480818 (1996-01-01), Matsumoto et al.
patent: 5527733 (1996-06-01), Nishizawa et al.
patent: 5674304 (1997-10-01), Fukada et al.
patent: 5693139 (1997-12-01), Nishizawa et al.
patent: 5796116 (1998-08-01), Nakata et al.
patent: 5807792 (1998-09-01), Ilg et al.
patent: 5906680 (1999-05-01), Meyerson
patent: 6025627 (2000-02-01), Forbes et al.
patent: 6042654 (2000-03-01), Comita et al.
patent: 6159852 (2000-12-01), Nuttall et al.
patent: 6232196 (2001-05-01), Raaijmakers et al.
patent: 6235568 (2001-05-01), Murthy et al.
patent: 6284686 (2001-09-01), Marlor
patent: 6291319 (2001-09-01), Yu et al.
patent: 6335280 (2002-01-01), van der Jeugd
patent: 6348420 (2002-02-01), Raaijmakers et al.
patent: 6352945 (2002-03-01), Matsuki et al.
patent: 6358829 (2002-03-01), Yoon et al.
patent: 6383955 (2002-05-01), Matsuki et al.
patent: 6410463 (2002-06-01), Matsuki
patent: 6451119 (2002-09-01), Sneh et al.
patent: 6458718 (2002-10-01), Todd
patent: 6489241 (2002-12-01), Thilderkvist et al.
patent: 6544900 (2003-04-01), Raaijmakers et al.
patent: 6559520 (2003-05-01), Matsuki et al.
patent: 6562720 (2003-05-01), Thilderkvist et al.
patent: 6797558 (2004-09-01), Nuttall et al.
patent: 6821825 (2004-11-01), Todd
patent: 2001/0020712 (2001-09-01), Raaijmakers et al.
patent: 2001/0024871 (2001-09-01), Yagi
patent: 2001/0045604 (2001-11-01), Oda et al.
patent: 2001/0046567 (2001-11-01), Matsuki et al.
patent: 2001/0055672 (2001-12-01), Todd
patent: 2002/0090818 (2002-07-01), Thilderkvist et al.
patent: 2002/0093042 (2002-07-01), Oh et al.
patent: 2002/0142557 (2002-10-01), Hashimoto et al.
patent: 2002/0145168 (2002-10-01), Bojarczuk, Jr. et al.
patent: 2002/0168868 (2002-11-01), Todd
patent: 2002/0173113 (2002-11-01), Todd
patent: 2002/0173130 (2002-11-01), Pomerede et al.
patent: 2002/0197831 (2002-12-01), Todd et al.
patent: 2003/0022528 (2003-01-01), Todd
patent: 2003/0036268 (2003-02-01), Brabant et al.
patent: 2003/0082300 (2003-05-01), Todd et al.
patent: 2003/0189208 (2003-10-01), Law et al.
patent: 2004/0033674 (2004-02-01), Todd
patent: 2004/0226911 (2004-11-01), Dutton et al.
patent: 2004/0253776 (2004-12-01), Hoffmann et al.
patent: 2005/0045905 (2005-03-01), Chu et al.
patent: 2005/0079691 (2005-04-01), Kim et al.
patent: 1 150 345 (2001-10-01), None
patent: 58098917 (1983-06-01), None
patent: 62-171999 (1987-07-01), None
patent: 63062313 (1988-03-01), None
patent: 01-270593 (1989-10-01), None
patent: 02-172895 (1990-07-01), None
patent: 03-286522 (1991-12-01), None
patent: 05-047665 (1993-02-01), None
patent: 5102189 (1993-04-01), None
patent: 2001-111000 (2001-04-01), None
patent: 2001-189312 (2001-05-01), None
patent: 2001-189312 (2001-07-01), None
patent: WO 98/20524 (1998-05-01), None
patent: WO 01/41544 (2001-06-01), None
patent: WO 02/064853 (2002-08-01), None
patent: WO 02/065508 (2002-08-01), None
patent: WO 02/065516 (2002-08-01), None
patent: WO 02/065517 (2002-08-01), None
patent: WO 02/065525 (2002-08-01), None
patent: WO 02/080244 (2002-10-01), None
patent: WO 02/097864 (2002-12-01), None
patent: WO 2005/038890 (2005-04-01), None
Lee, et al.,Cyclic technique for the enhancement of highly oriented diamond film growt, Elsevier Science S.A., Thin Solid Films (1997) 264-268.
Choi, et al.,Stability of TiB2as a Diffusion Barrier on Silicon.Electrochemical Society vol. 138 No. 10 Oct. 1991.
Paranjpe, et al.,Atomic Layer Deposition of AIOxfor Thin Film Head Gap Applications, ECS, Journal of the Electrochemical Society, 148 (9) G465-G471 (2001).
Article by Uchino et al., entitled “A Raised Source/Drain Technology Using In-situ P-doped SiGe and B-doped Si for 0.1-μm CMOS ULSIs”, IEDM, Dec. 1997, Technical Digest, pp. 479-482.
Article by Sedgwick et al., entitled “Selective SiGe and heavily as doped Si deposited at low temperature by atmospheric pressure chemical vapor deposition”, Journal of Vacuum Science & Technology, May/Jun. 1993, No. 3, pp. 1124-1128.
Article by Kamins et al., entitled “Kinetics of Selective epitaxial deposition Si1—xGex”, American Institute of Physics, Aug. 1992, No. 6, pp. 669-671.
Article by Menon et al., entitled “Loading effect in SiGe layers grown by dichlorosilane-and silane-based epitaxy”, American Institute of Physics, Nov. 2001, vol. 90, No. 9, pp. 4805-4809.
International Search Report mailed Feb. 22, 2005 for PCT/US2004/030872 (AMAT/8539-PCT).
Jeong, et al. “Growth and Characterization of Aluminum Oxide (Al2O3) Thin Films by Plasma-Assisted Atomic Layer Controlled Deposition,” J. Korean Inst. Met. Mater., vol. 38, No. 10, Oct. 2000 pp. 1395-1399.
Jeong, et al. “Plasma-assisted Atomic Layer Growth of High-Quality Aluminum Oxide Thin Films,” Jpn. J. Appl. Phys. 1, Regul. Pap. Short Notes, vol. 40, No. 1, Jan. 2001 pp. 285-289.
Invitation to Pay Additional Fees and Partial International Search Report for PCT/US2005/016160 Feb. 8, 2006, 6 pages.
International Search Report dated Mar. 30, 2006 for International Application No. PCT/US2005/016160 (APPM/008539PC02) , 10 pages.
Written Opinion of the International Searching Authority dated Mar. 30, 2006 for International Application No. PCT/US2005/016160 (APPM/008539PC02) , 12 pages.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Methods of selective deposition of heavily doped epitaxial SiGe does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Methods of selective deposition of heavily doped epitaxial SiGe, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Methods of selective deposition of heavily doped epitaxial SiGe will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3796531

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.