Method of manufacturing flash memory device

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

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C438S264000, C257S317000, C257S321000, C257SE21681

Reexamination Certificate

active

11146168

ABSTRACT:
A method of manufacturing a flash memory device, including the steps of forming a floating gate electrode that is a doped polysilicon film on a semiconductor substrate, forming a polysilicon layer in the pattern of HSG on the doped polysilicon film, conducting a nitrifying process after forming the HSG polysilicon layer, forming an Al2O3film on the resultant structure treated by the nitrifying process, and forming a control gate electrode on the Al2O3film.

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Official Action in Counterpart Korean Application No. 2004-78292 dated Jan. 31, 2006.

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