Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2007-01-02
2007-01-02
Smith, Bradley K. (Department: 2891)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C438S264000, C257S317000, C257S321000, C257SE21681
Reexamination Certificate
active
11146168
ABSTRACT:
A method of manufacturing a flash memory device, including the steps of forming a floating gate electrode that is a doped polysilicon film on a semiconductor substrate, forming a polysilicon layer in the pattern of HSG on the doped polysilicon film, conducting a nitrifying process after forming the HSG polysilicon layer, forming an Al2O3film on the resultant structure treated by the nitrifying process, and forming a control gate electrode on the Al2O3film.
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Fulk Steven J.
Hynix / Semiconductor Inc.
Marshall & Gerstein & Borun LLP
Smith Bradley K.
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