Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2007-07-24
2007-07-24
Ton, David (Department: 2138)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
C345S055000, C358S505000
Reexamination Certificate
active
10641605
ABSTRACT:
A horizontal scan circuit comprises a column selector and a plurality of block selectors. A column selector is used to address particular columns of pixels within blocks. A block selector is used to select a particular block and to select the particular columns of the selected block that are addressed by the column selector. Each block selector typically comprises a single D-type flip-flop that is associated with a block of pixel columns. The block selectors are arranged such that the blocks can be scanned from left-to-right or right-to-left. The column selector comprises an asynchronous counter and a decoder that are further arranged to provide sub-sampling and horizontal adding functions. The use of block and column selectors reduces the number of relatively large D-type flip-flops (which conserves die area) and reduces the parasitic capacitance associated with the otherwise required relatively large number of inputs of the column selection circuit drivers.
REFERENCES:
patent: 5157482 (1992-10-01), Cosgrove
patent: 5477345 (1995-12-01), Tse
patent: 6127992 (2000-10-01), Sano
patent: 6346991 (2002-02-01), Amidei
patent: 6410961 (2002-06-01), Hayashi
patent: 6646680 (2003-11-01), Mead et al.
patent: 6922183 (2005-07-01), Ting et al.
patent: 6927433 (2005-08-01), Hynecek
Eastman Kodak Company
Ton David
Watkins Peyton C.
LandOfFree
Bidirectional horizontal scan circuit with sub-sampling and... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Bidirectional horizontal scan circuit with sub-sampling and..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Bidirectional horizontal scan circuit with sub-sampling and... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3734433