Method for identifying an integrated circuit

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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C714S734000

Reexamination Certificate

active

07117414

ABSTRACT:
An identifier is provided for an integrated circuit with a memory composed of a multiplicity of memory cells. The circuit has a manufacture-related memory cell defect pattern formed of defective memory cells. The method of identifying the integrated circuit utilizes the memory cell defect pattern to generate a circuit identification number for identifying the integrated circuit.

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