Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2006-05-09
2006-05-09
Pham, Long (Department: 2814)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C438S263000, C438S264000, C438S424000
Reexamination Certificate
active
07041554
ABSTRACT:
Flash memory devices are provided including an integrated circuit substrate and a stack gate structure on the integrated circuit substrate. A trench isolation region is provided on the integrated circuit substrate adjacent the stack gate structure. A portion of the stack gate structure adjacent a trench sidewall of the trench isolation region may include a first nitrogen doped layer.
REFERENCES:
patent: 2002/0123234 (2002-09-01), Trapp
patent: 2003/0052376 (2003-03-01), Lee et al.
patent: 2003/0173615 (2003-09-01), San et al.
patent: 010061403 (2001-07-01), None
Lee Chang-Hyun
Park Dong-Gun
Myers Bigel & Sibley & Sajovec
Pham Long
Samsung Electronics Co,. Ltd.
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