Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2006-01-31
2006-01-31
Chaudhari, Chandra (Department: 2891)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C438S287000
Reexamination Certificate
active
06991985
ABSTRACT:
Disclosed is a method of manufacturing a semiconductor device. A floating gate is formed and a nitrification process is then implemented. With the disclosed process, it is possible to improve the roughness of the top surface of the floating gate electrode. Furthermore, a nitrification process and a dielectric film formation process are implemented in-situ, which simplifies the manufacturing process.
REFERENCES:
patent: 6127227 (2000-10-01), Lin et al.
patent: 6344394 (2002-02-01), Kaneoka
patent: 6362045 (2002-03-01), Lin et al.
patent: 6396099 (2002-05-01), Joo et al.
patent: 6512264 (2003-01-01), Ogle et al.
patent: 2003/0153149 (2003-08-01), Dong et al.
patent: 2246162 (1990-10-01), None
patent: 1019990068095 (2001-07-01), None
Office Action from the R.O.C. (Taiwan) Intellectual Property Office dated Mar. 18, 2005 (9 pages).
Office Action from the Korean Intellectual Property Office dated Jun. 7, 2005 (2 pages).
Dong Cha Deok
Shin Seung Woo
Chaudhari Chandra
Hynix / Semiconductor Inc.
Marshall & Gerstein & Borun LLP
LandOfFree
Method of manufacturing a semiconductor device does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method of manufacturing a semiconductor device, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of manufacturing a semiconductor device will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3541650