Method of manufacturing a semiconductor device

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

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C438S287000

Reexamination Certificate

active

06991985

ABSTRACT:
Disclosed is a method of manufacturing a semiconductor device. A floating gate is formed and a nitrification process is then implemented. With the disclosed process, it is possible to improve the roughness of the top surface of the floating gate electrode. Furthermore, a nitrification process and a dielectric film formation process are implemented in-situ, which simplifies the manufacturing process.

REFERENCES:
patent: 6127227 (2000-10-01), Lin et al.
patent: 6344394 (2002-02-01), Kaneoka
patent: 6362045 (2002-03-01), Lin et al.
patent: 6396099 (2002-05-01), Joo et al.
patent: 6512264 (2003-01-01), Ogle et al.
patent: 2003/0153149 (2003-08-01), Dong et al.
patent: 2246162 (1990-10-01), None
patent: 1019990068095 (2001-07-01), None
Office Action from the R.O.C. (Taiwan) Intellectual Property Office dated Mar. 18, 2005 (9 pages).
Office Action from the Korean Intellectual Property Office dated Jun. 7, 2005 (2 pages).

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