Method and circuit arrangement for testing electrical modules

Details Method and circuit arrangement for testing electrical modules Method and circuit arrangement for testing electrical modules

2008-01-29

2008-01-29

Lamarre, Guy (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S739000, C714S736000, C714S737000

Reexamination Certificate

active

07325182

ABSTRACT:
The invention relates to a method for testing electrical modules. A test pattern of input signals is applied to each module to be tested as test specimen, and the actual responses of the test specimen to the test pattern is compared with the desired responses. The comparison result is evaluated for the purpose of displaying test assessments. According to one embodiment of the invention, to supply the desired responses, a reference module produced with the same design and technology as the test specimen and tested as entirely satisfactory is utilized. The same test pattern as for the test specimen is applied to the reference module. The invention furthermore relates to circuit arrangements for carrying out this method, in particular for testing data memories.

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