Methods of fabricating nonvolatile memory devices having...

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

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Details

Other Related Categories

C438S264000, C438S524000, C257SE21423

Type

Reexamination Certificate

Status

active

Patent number

08008153

Description

ABSTRACT:
Nonvolatile memory devices are provided including an integrated circuit substrate and a charge storage pattern on the integrated circuit substrate. The charge storage pattern has a sidewall and a tunnel insulating layer is provided between the charge storage pattern and the integrated circuit substrate. A gate pattern is provided on the charge storage pattern. A blocking insulating layer is provided between the charge storage pattern and the gate pattern. The sidewall of the charge storage pattern includes a first nitrogen doped layer. Related methods of fabricating nonvolatile memory devices are also provided herein.

REFERENCES:
patent: 4774197 (1988-09-01), Haddad et al.
patent: 5464792 (1995-11-01), Tseng et al.
patent: 5571734 (1996-11-01), Tseng et al.
patent: 5770502 (1998-06-01), Lee
patent: 5837585 (1998-11-01), Wu et al.
patent: 5869858 (1999-02-01), Ozawa et al.
patent: 5966615 (1999-10-01), Fazan et al.
patent: 6001713 (1999-12-01), Ramsbey et al.
patent: 6069041 (2000-05-01), Tanigami et al.
patent: 6372578 (2002-04-01), Muramatsu
patent: 6413819 (2002-07-01), Zafar et al.
patent: 6489649 (2002-12-01), Kobayashi et al.
patent: 7041554 (2006-05-01), Lee et al.
patent: 2002/0123234 (2002-09-01), Trapp
patent: 2003/0052376 (2003-03-01), Lee et al.
patent: 2003/0173615 (2003-09-01), San et al.
patent: 05-267684 (1993-10-01), None
patent: 06-029314 (1994-02-01), None
patent: 06-077493 (1994-03-01), None
patent: 09-129757 (1997-05-01), None
patent: 010061403 (2001-07-01), None

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