Process for cleaning a semiconductor wafer using a cleaning...

Cleaning and liquid contact with solids – Processes – Using sequentially applied treating agents

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C134S026000, C134S027000, C134S029000, C134S002000, C134S003000

Reexamination Certificate

active

07938911

ABSTRACT:
Semiconductor wafers are cleaned using a cleaning solution containing an alkaline ammonium component in an initial composition, wherein the semiconductor wafer is brought into contact with the cleaning solution in an individual-wafer treatment, and in the course of cleaning hydrogen fluoride is added as further component to the cleaning solution, and the cleaning solution has at the end of cleaning, a composition that differs from the initial composition.

REFERENCES:
patent: 3607480 (1971-09-01), Harrap et al.
patent: 3923567 (1975-12-01), Lawrence
patent: 4171242 (1979-10-01), Liu
patent: 4261791 (1981-04-01), Shwartzman
patent: RE31198 (1983-04-01), Binns
patent: 4545918 (1985-10-01), Pralus
patent: 4556432 (1985-12-01), Erckel et al.
patent: 4589924 (1986-05-01), Erckel et al.
patent: 4778532 (1988-10-01), McConnell et al.
patent: 4795582 (1989-01-01), Ohmi et al.
patent: 4891325 (1990-01-01), Hezel et al.
patent: 4899767 (1990-02-01), McConnell et al.
patent: 4917123 (1990-04-01), McConnell et al.
patent: 5275184 (1994-01-01), Nishizawa et al.
patent: 5520744 (1996-05-01), Fujikawa et al.
patent: 5656097 (1997-08-01), Olesen et al.
patent: 5722441 (1998-03-01), Teramoto
patent: 5783495 (1998-07-01), Li et al.
patent: 5810940 (1998-09-01), Fukazawa et al.
patent: 5893756 (1999-04-01), Berman et al.
patent: 5931173 (1999-08-01), Schiele
patent: 5932022 (1999-08-01), Linn et al.
patent: 5933739 (1999-08-01), Lin
patent: 5950645 (1999-09-01), Olesen et al.
patent: 5983909 (1999-11-01), Yeol et al.
patent: 6037271 (2000-03-01), Carlson et al.
patent: 6044851 (2000-04-01), Grieger et al.
patent: 6158445 (2000-12-01), Olesen et al.
patent: 6158447 (2000-12-01), Kamikawa et al.
patent: 6171865 (2001-01-01), Weigl et al.
patent: 6443812 (2002-09-01), Costas et al.
patent: 6482749 (2002-11-01), Billington et al.
patent: 6584989 (2003-07-01), Taft et al.
patent: 6641899 (2003-11-01), Colburn et al.
patent: 6767409 (2004-07-01), Aoki et al.
patent: 6848455 (2005-02-01), Shrinivasan et al.
patent: 6875706 (2005-04-01), Lee et al.
patent: 7384870 (2008-06-01), Saito et al.
patent: 7784998 (2010-08-01), Jang et al.
patent: 7819984 (2010-10-01), DeKraker et al.
patent: 2002/0035762 (2002-03-01), Okuda et al.
patent: 2002/0189640 (2002-12-01), Linn et al.
patent: 2003/0139059 (2003-07-01), Andreas
patent: 2004/0031503 (2004-02-01), Eitoku
patent: 2005/0000545 (2005-01-01), Inagaki
patent: 2006/0040595 (2006-02-01), Svirchevski et al.
patent: 2007/0163618 (2007-07-01), Kim et al.
patent: 2008/0233753 (2008-09-01), Idani
patent: 0 805 484 (1997-11-01), None
patent: 04196424 (1992-07-01), None
patent: 2007019506 (2007-01-01), None
patent: 2007134690 (2007-05-01), None
patent: 2007149891 (2007-06-01), None
patent: 0305093 (2001-09-01), None
patent: 1020030052817 (2003-06-01), None
patent: 1020040007876 (2004-01-01), None
patent: 98/56726 (1998-12-01), None
patent: WO 9856726 (1998-12-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Process for cleaning a semiconductor wafer using a cleaning... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Process for cleaning a semiconductor wafer using a cleaning..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Process for cleaning a semiconductor wafer using a cleaning... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2702075

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.