Multiple uses for BIST test latches

Details Multiple uses for BIST test latches Multiple uses for BIST test latches

2011-08-23

2011-08-23

Britt, Cynthia (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S726000, C714S729000

Reexamination Certificate

active

08006153

ABSTRACT:
A method, an apparatus, and a computer program are provided to utilize built-in self test (BIST) latches for multiple purposes. Conventionally, BIST latches are single purpose. Hence, separate latches are utilized for array built-in self test (ABIST) and logic built-in self test (LBIST) operations. By having the separate latches, though, a substantial amount area is lost. Therefore, to better utilize the latches and the area, ABIST latches are reconfigured to utilize some previously unused ports to allow for multiple uses for the latches, such as for LBIST.

REFERENCES:
patent: 5960008 (1999-09-01), Osawa et al.
patent: 5961653 (1999-10-01), Kalter et al.
patent: 6088823 (2000-07-01), Ayres et al.
patent: 6829728 (2004-12-01), Cheng et al.
patent: 6971054 (2005-11-01), Kurtulik et al.
patent: 7146547 (2006-12-01), Fukatsu
patent: 2003/0110431 (2003-06-01), Davies et al.
patent: 2005/0063211 (2005-03-01), Atallah et al.
patent: 2006/0012392 (2006-01-01), Rencher et al.
patent: 2006/0156091 (2006-07-01), Aipperspach et al.
patent: 2006/0176745 (2006-08-01), Eustis et al.
Lefebvre, M.E.; Functional test and diagnosis: a proposed JTAG sample mode scan tester Test Conference, 1990. Proceedings., International Digital Object Identifier: 10.1109/TEST.1990.114035 Publication Year: 1990 , pp. 294-303.

Affiliated with

Also associated with

Rating

Multiple uses for BIST test latches does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Multiple uses for BIST test latches, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Multiple uses for BIST test latches will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2624975