Method for early failure recognition in power semiconductor modu

Details Method for early failure recognition in power semiconductor modu Method for early failure recognition in power semiconductor modu

1996-07-08

2000-11-07

Iqbal, Nadeem

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

257355, G06F 1300

Patent

active

06145107&

ABSTRACT:
A method for early failure recognition in power semiconductor modules which employs a measurement across a resistor between a bonded emitter terminal and a bonded auxiliary emitter terminal that identifies the degradation of the bond point which triggers an early warning signal so that the power semiconductor module can be changed before failure and the overall reliability of an electronic power system can thereby be increased.

REFERENCES:
patent: 4380045 (1983-04-01), Ishii
patent: 4642616 (1987-02-01), Goodwin
patent: 4745339 (1988-05-01), Izawa et al.
patent: 5061863 (1991-10-01), Mori et al.
patent: 5187387 (1993-02-01), Kawauchi
patent: 5345377 (1994-09-01), Edwards
patent: 5396117 (1995-03-01), Housen et al.
patent: 5442216 (1995-08-01), Gough
patent: 5483148 (1996-01-01), Torrey
patent: 5559438 (1996-09-01), Bedouet et al.
patent: 5572416 (1996-11-01), Jacobs et al.
patent: 5612488 (1997-03-01), Yamamoto et al.
patent: 5640095 (1997-06-01), Beier et al.
Proceedings of the 20th International Symposium for Testing and Failure Analysis, "Reliability Testing and Analysis of IGBT Power Semiconductor Modules", P. Jacob et al., pp. 319-325, Nov. 1994.
Quality and Reliability Engineering International, "Electrical Measurements as Performance Indicators of Electromigration", B.K. Jones et al., vol. 10, 315-318, Feb. 1994.
Electronics, "Harmonic Testing Pinpoints Passive Component Flaws", Vilhelm Peterson et al., pp. 93-100, Jul. 1966.

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