4. Measuring and testing
  5. Miscellaneous

Babak Farokhzad

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Method for early failure recognition in power semiconductor modu

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Method for estimating the service life of a power semiconductor

Measuring and testing – Miscellaneous
Patent

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Profile ID: LFUS-PAI-P-651590

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