Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Patent
1997-07-08
1999-09-14
Chaudhari, Chandra
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
438588, H01L 218247
Patent
active
059536101
ABSTRACT:
According to the present invention, there is provided a non-volatile semiconductor memory device including a memory cell array in which a plurality of memory cells are arranged, wherein the memory cells contain two or more types of memory cells, which differs in gate couple ratio. Each memory cell includes source-drain regions provided apart from each other in a semiconductor substrate having a conductivity type, the source-drain regions having a conductivity type opposite to that of the semiconductor substrate, a floating gate provided above a channel region formed between the source-drain regions, and a control gate provided above a surface of the floating gate, and the memory cells contain two or more types of memory cells, which differ in relation to an area of a region in which the floating gate and the control gate overlap. The memory cells having a low gate couple ratio exhibit characteristics similar to those of a mask ROM, which gives priority to reading, whereas the memory cells having a high gate couple ratio, exhibit excellent programming and erasing characteristics.
REFERENCES:
patent: 4223394 (1980-09-01), Pathak et al.
patent: 4811291 (1998-03-01), De Ferron
patent: 4833514 (1989-05-01), Esquivel et al.
patent: 5068697 (1991-11-01), Noda et al.
patent: 5142496 (1992-08-01), Van Buskirk
patent: 5157626 (1992-10-01), Watanabe
patent: 5158902 (1992-10-01), Hanada
patent: 5163021 (1992-11-01), Mehrotra et al.
patent: 5311466 (1994-05-01), Natale et al.
patent: 5349558 (1994-09-01), Cleveland et al.
patent: 5463587 (1995-10-01), Maruyama
patent: 5465231 (1995-11-01), Ohsaki
patent: 5472892 (1995-12-01), Gwen et al.
patent: 5545906 (1996-08-01), Ogura et al.
patent: 5568418 (1996-11-01), Crisenza et al.
Shin-ichi Kobayashi et al., "Memory Array Architecture and Decoding Scheme for 3V Only Sector Erasable DINOR Flash Memory", vol. 12, No. 1, pp. 97-98.
Seiji Yamada et al., "A Self-Convergence Erasing Scheme for a Simple Stacked Gate Flash EEPROM", IEEE, vol. 11, No. 4, pp. 1-4, 1991.
Chaudhari Chandra
NKK Corporation
LandOfFree
Method of fabricating non volatile memory device with memory cel does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method of fabricating non volatile memory device with memory cel, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of fabricating non volatile memory device with memory cel will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1519702