4. Measuring and testing
  5. Instrument proving or calibrating
  6. Volume of flow, speed of flow, volume rate of flow, or mass...

Yuichi Miyagawa

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Automatic calibration apparatus for a partial gas pressure measu

Measuring and testing – Instrument proving or calibrating – Volume of flow – speed of flow – volume rate of flow – or mass...
Patent

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Light-reflecting and heating type oximeter

Surgery – Truss – Pad
Patent

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Multilayer wiring substrate, semiconductor package, and...

Active solid-state devices (e.g. – transistors – solid-state diode – Housing or package – With contact or lead
Reexamination Certificate

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Semiconductor device having spacer formed on semiconductor...

Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Chip mounted on chip
Reexamination Certificate

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Semiconductor wafer, semiconductor device and manufacturing...

Active solid-state devices (e.g. – transistors – solid-state diode – Physical configuration of semiconductor – With peripheral feature due to separation of smaller...
Reexamination Certificate

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Profile ID: LFUS-PAI-P-1083136

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