4. Static information storage and retrieval
  5. Read/write circuit
  6. Testing

Yu-Wei Ting

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Device and method for detecting alignment of active areas...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

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Device and method for detecting alignment of bit lines and...

Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate

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Device and method for detecting alignment of deep trench...

Semiconductor device manufacturing: process – With measuring or testing – Electrical characteristic sensed
Reexamination Certificate

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Device and method for detecting alignment of deep trench...

Semiconductor device manufacturing: process – With measuring or testing
Reexamination Certificate

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Memory device and fabrication method thereof

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2755578

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