4. Electricity: measuring and testing
  5. Fault detecting in electric circuits and of electric components
  6. Of individual circuit component or element

Yu-Sin Yang

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Apparatus and method to inspect defect of semiconductor device

Semiconductor device manufacturing: process – With measuring or testing
Reexamination Certificate

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Chemical-mechanical polishing apparatus and method for...

Radiant energy – Photocells; circuits and apparatus – With circuit for evaluating a web – strand – strip – or sheet
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Method and apparatus for detecting a photolithography...

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

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Method and apparatus for detecting contaminants in...

Thermal measuring and testing – Temperature measurement – Nonelectrical – nonmagnetic – or nonmechanical temperature...
Reexamination Certificate

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Method and apparatus for inspecting a substrate

Optics: measuring and testing – Inspection of flaws or impurities
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Profile ID: LFUS-PAI-P-2398808

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