4. Computer-aided design and analysis of circuits and semiconductor
  5. Design of semiconductor mask or reticle
  6. Analysis and verification

Youval Nehmadi

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Design-based monitoring

Semiconductor device manufacturing: process – With measuring or testing
Reexamination Certificate

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Dynamic inline yield analysis and prediction of a defect...

Data processing: generic control systems or specific application – Specific application – apparatus or process – Product assembly or manufacturing
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Stage yield prediction

Computer-aided design and analysis of circuits and semiconductor – Design of semiconductor mask or reticle – Analysis and verification
Reexamination Certificate

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System, method and computer software product for inspecting...

Image analysis – Applications – Manufacturing or product inspection
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Profile ID: LFUS-PAI-P-2242216

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