4. Electricity: measuring and testing
  5. Fault detecting in electric circuits and of electric components
  6. Of individual circuit component or element

Young-hun Seo

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DRAM device with a refresh period that varies responsive to...

Static information storage and retrieval – Read/write circuit – Differential sensing
Reexamination Certificate

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Method for testing semiconductor memory device using probe...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Methods and apparatus to form gates in semiconductor devices

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate

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Needle alignment verification circuit and method for...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Semiconductor integrated circuit

Electronic digital logic circuitry – Interface – Supply voltage level shifting
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Profile ID: LFUS-PAI-P-2328113

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