Static information storage and retrieval – Read/write circuit – Differential sensing
Reexamination Certificate
2007-02-13
2007-02-13
Elms, Richard (Department: 2824)
Static information storage and retrieval
Read/write circuit
Differential sensing
C365S189070, C365S189090, C365S191000, C365S149000
Reexamination Certificate
active
11117159
ABSTRACT:
A semiconductor device includes a DRAM and a temperature sense circuit. The DRAM has a refresh period that varies responsive to a temperature signal. The temperature sense circuit is configured to generate the temperature signal having a first binary value in response to sensing a temperature of the DRAM of at least a first temperature level, and to generate the temperature signal having a second binary value in response to sensing a temperature of the DRAM of less than a second temperature level, wherein the second temperature value is less than the first temperature value.
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Notice to Submit a Response for Korean Patent Application No. 10-2004-004416 mailed on Nov. 24, 2005.
Cho Beob-rae
Choi Jong-hyun
Seo Young-hun
Elms Richard
Luu Pho M.
Myers Bigel & Sibley Sajovec, PA
Samsung Electronics Co,. Ltd.
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