4. Image analysis
  5. Applications
  6. Manufacturing or product inspection

Yonatan Lehman

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Data converter apparatus and method particularly useful for...

Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate

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Raster frame beam system for electron beam lithography

Radiant energy – Irradiation of objects or material – Irradiation of semiconductor devices
Reexamination Certificate

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Reticle design inspection system

Optics: measuring and testing – Inspection of flaws or impurities
Reexamination Certificate

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Reticle design inspection system

Optics: measuring and testing – Inspection of flaws or impurities
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2480796

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