4. Static information storage and retrieval
  5. Read/write circuit
  6. Differential sensing

Yeong-Chang Ahn

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Redundancy circuit for semiconductor integrated circuit

Error detection/correction and fault detection/recovery – Pulse or data error handling – Replacement of memory spare location – portion – or segment
Patent

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Semiconductor memory apparatus having refresh test circuit

Static information storage and retrieval – Read/write circuit – Testing
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Test apparatus for semi-conductor memory device

Static information storage and retrieval – Read/write circuit – Differential sensing
Patent

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Profile ID: LFUS-PAI-P-935726

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