Redundancy circuit for semiconductor integrated circuit

Error detection/correction and fault detection/recovery – Pulse or data error handling – Replacement of memory spare location – portion – or segment

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3651853, G11C 2900

Patent

active

060922230

ABSTRACT:
A redundancy circuit for a semiconductor integrated circuit is disclosed, which includes each cell of the column redundancy cell block corresponding to each cell of the cell sub-array is connected opposite to the connection of the cells of the cell sub-array, wherein a state that an electric charge corresponding to a data written into each cell of the cell sub-array and the column redundancy cell block is discharged, is measured for thus accurately checking the position of the repaired cell after the redundancy operation is performed.

REFERENCES:
patent: 5018104 (1991-05-01), Urai
patent: 5051691 (1991-09-01), Wang
patent: 5113371 (1992-05-01), Hamada
patent: 5319599 (1994-06-01), Kato
patent: 5341329 (1994-08-01), Takebuchi
patent: 5515320 (1996-05-01), Miwa
patent: 5715253 (1998-02-01), Kim et al.

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