4. Optical: systems and elements
  5. Optical modulator
  6. Light wave temporal modulation

Ya-Wen Lee

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Method and device for wafer backside alignment overlay accuracy

Semiconductor device manufacturing: process – With measuring or testing – Optical characteristic sensed
Reexamination Certificate

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Method and system for patterning alignment marks on a...

Semiconductor device manufacturing: process – Formation of electrically isolated lateral semiconductive... – Having substrate registration feature
Reexamination Certificate

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Method and system for patterning alignment marks on a...

Optical: systems and elements – Optical modulator – Light wave temporal modulation
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Method and system for secure authentication in a wireless...

Electrical computers and digital processing systems: support – Multiple computer communication using cryptography – Particular communication authentication technique
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Profile ID: LFUS-PAI-P-3176474

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