4. Electronic digital logic circuitry
  5. Clocking or synchronizing of logic stages or gates

Wong Cabello Lutsch Rutherford and Brucculeri LLP

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Contact system for wafer level testing

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Distributed clock generator for semiconductor devices and...

Electronic digital logic circuitry – Clocking or synchronizing of logic stages or gates
Reexamination Certificate

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Method and apparatus for conditioning of a digital pulse

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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