4. Electricity: measuring and testing
  5. Fault detecting in electric circuits and of electric components
  6. Of individual circuit component or element

William Shen

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Automatic generating of timing constraints for the...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
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Method and apparatus for testing integrated circuit core...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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Method and system of testing data retention of memory

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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On-chip circuit for transition delay fault test pattern...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Skew detection correction
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Test clocking scheme

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Profile ID: LFUS-PAI-P-2864004

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