4. Electrical connectors
  5. Including handle or distinct manipulating means
  6. Randomly manipulated implement

William E. Thurston

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Algoristic spring as probe

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Dual tapered spring probe

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Eccentric offset Kelvin probe

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Electrical contact interface

Electrical connectors – With insulation other than conductor sheath – Plural-contact coupling part
Reexamination Certificate

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Probe and test socket assembly

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Profile ID: LFUS-PAI-P-1574963

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