Dual tapered spring probe

Details Dual tapered spring probe Dual tapered spring probe

2006-12-26

2006-12-26

Patel, Paresh (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C439S700000, C439S824000

Reexamination Certificate

active

07154286

ABSTRACT:
A contact spring probe includes a plunger and a spring with a pair of opposed closed coils separated by an open coil. The plunger is secured at one end to one set of closed coils with a shoulder, flange or barb extending from the body of the plunger.

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“Product Close-up: Less is More with New Center Probe Test-Socket Technology” by Bruce Dechillo and Frank Folmsbee, published in Nov./Dec. 2004 Chip Scale Review, pp. 43-47.

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