Algoristic spring as probe

Details Algoristic spring as probe Algoristic spring as probe

2006-12-12

2006-12-12

Hollington, Jermele (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S754090

Reexamination Certificate

active

07148713

ABSTRACT:
A contact probe including a length of wire with head, coil and tail sections. The head and tail sections may be lengthened and offset from the longitudinal axis of the coil section to allow the probes to be densely packed in a substrate material. Two probes may be interleaved to provide improved electrical performance of the probe.

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patent: 6741085 (2004-05-01), Khandros et al.
patent: 2002/0110761 (2002-08-01), Fork et al.

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