Eccentric offset Kelvin probe

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element

Reexamination Certificate

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Reexamination Certificate

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11137187

ABSTRACT:
An eccentric offset Kelvin probe with a beveled contact tip radially offset from the longitudinal axis of the probe which provides a reduced tip spacing between adjacent pairs of probes.

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patent: 6831452 (2004-12-01), McTigue

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