4. Error detection/correction and fault detection/recovery
  5. Pulse or data error handling
  6. Digital logic testing

Wern-Yan Koe

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Combinational test pattern generation method and apparatus

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Combinational test pattern generation method and apparatus

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Cross switch supporting simultaneous data traffic in...

Electrical computers and digital data processing systems: input/ – Intrasystem connection – Bus interface architecture
Reexamination Certificate

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Direct access logic testing in integrated circuits

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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DSP memory bank rotation

Electrical computers and digital processing systems: memory – Address formation – Address mapping
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2463341

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