4. Material or article handling
  5. Apparatus for charging a load holding or supporting element...
  6. Load holding or supporting element including gripping means

Wayne K. Borglum

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Apparatus for handling semiconductor wafers

Material or article handling – Apparatus for charging a load holding or supporting element... – Load holding or supporting element including gripping means
Patent

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High accuracy film thickness measurement system

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent

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Semiconductor surface resistivity probe with semiconductor tempe

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
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Profile ID: LFUS-PAI-P-113188

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