4. Data processing: measuring, calibrating, or testing
  5. Testing system
  6. Signal generation or waveform shaping

Venugopal Puvvada

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Electro-migration (EM) and voltage (IR) drop analysis of...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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Reducing time to design integrated circuits including...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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Timing closure for system on a chip using voltage drop based...

Data processing: measuring – calibrating – or testing – Testing system – Signal generation or waveform shaping
Reexamination Certificate

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Timing closure for system on a chip using voltage drop based...

Data processing: measuring – calibrating – or testing – Testing system – Signal generation or waveform shaping
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2378003

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