4. Active solid-state devices (e.g., transistors, solid-state diode
  5. Test or calibration structure

Valentin Rosskopf

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Device architecture and process for improved vertical memory...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

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Integrated circuit configuration for testing transistors,...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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Method for examining structures on a wafer

Radiation imagery chemistry: process – composition – or product th – Including control feature responsive to a test or measurement
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Method for fabricating and checking structures of electronic...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
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Semiconductor product having a semiconductor substrate and a...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2368066

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