4. Electricity: measuring and testing
  5. Fault detecting in electric circuits and of electric components
  6. Of individual circuit component or element

Travis Eiles

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Device speed alteration by electron-hole pair injection and...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Isolation structure configurations for modifying stresses in...

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
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Isolation structure configurations for modifying stresses in...

Active solid-state devices (e.g. – transistors – solid-state diode – Integrated circuit structure with electrically isolated... – Including high voltage or high power devices isolated from...
Reexamination Certificate

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Isolation structure configurations for modifying stresses in...

Active solid-state devices (e.g. – transistors – solid-state diode – Integrated circuit structure with electrically isolated... – Including dielectric isolation means
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Thermally controlled sold immersion lens fixture

Optical: systems and elements – Lens – With support
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Profile ID: LFUS-PAI-P-2840387

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