4. Measuring and testing
  5. Surface and cutting edge testing
  6. Roughness

Topometrix Corporation

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Corporate Assignee

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High resolution electromechanical translation device

Electrical generator or motor structure – Non-dynamoelectric – Piezoelectric elements and devices
Patent

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Resonance contact scanning force microscope

Measuring and testing – Surface and cutting edge testing – Roughness
Patent

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Resonance contact scanning force microscope

Measuring and testing – Surface and cutting edge testing – Roughness
Patent

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Resonance contact scanning force microscope

Measuring and testing – Surface and cutting edge testing – Roughness
Patent

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Scanning probe microscope apparatus for use in a scanning electr

Radiant energy – Inspection of solids or liquids by charged particles
Patent

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Profile ID: LFUS-PAI-P-139671

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