4. Semiconductor device manufacturing: process
  5. With measuring or testing

Tian Xia

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Image sensor monitor structure in scribe area

Semiconductor device manufacturing: process – With measuring or testing
Reexamination Certificate

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Method and apparatus for diagnosing broken scan chain based...

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Reexamination Certificate

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Method and apparatus for diagnosing broken scan chain based...

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Reexamination Certificate

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Method, equipment and system for resource acquisition

Electrical computers and digital processing systems: multicomput – Remote data accessing – Using interconnected networks
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Programmable jitter signal generator

Miscellaneous active electrical nonlinear devices – circuits – and – Signal converting – shaping – or generating – Having specific delay in producing output waveform
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Profile ID: LFUS-PAI-P-2378000

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