Method and apparatus for diagnosing broken scan chain based...

Data processing: measuring – calibrating – or testing – Testing system – Of circuit

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C712S016000

Reexamination Certificate

active

07426448

ABSTRACT:
A mechanism for diagnosing broken scan chains based on leakage light emission is provided. An image capture mechanism detects light emission from leakage current in complementary metal oxide semiconductor (CMOS) devices. The diagnosis mechanism identifies devices with unexpected light emission. An unexpected amount of light emission may indicate that a transistor is turned off when it should be turned on or vice versa. All possible inputs may be tested to determine whether a problem exists with transistors in latches or with transistors in clock buffers. Broken points in the scan chain may then be determined based on the locations of unexpected light emission.

REFERENCES:
patent: 6490702 (2002-12-01), Song et al.
patent: 7010735 (2006-03-01), Motika et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method and apparatus for diagnosing broken scan chain based... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and apparatus for diagnosing broken scan chain based..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for diagnosing broken scan chain based... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3978015

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.