Method and apparatus for diagnosing broken scan chain based...

Details Method and apparatus for diagnosing broken scan chain based... Method and apparatus for diagnosing broken scan chain based...

2004-02-03

2008-09-16

Raymond, Edward (Department: 2857)

Data processing: measuring, calibrating, or testing

Testing system

Of circuit

C712S016000

Reexamination Certificate

active

07426448

ABSTRACT:
A mechanism for diagnosing broken scan chains based on leakage light emission is provided. An image capture mechanism detects light emission from leakage current in complementary metal oxide semiconductor (CMOS) devices. The diagnosis mechanism identifies devices with unexpected light emission. An unexpected amount of light emission may indicate that a transistor is turned off when it should be turned on or vice versa. All possible inputs may be tested to determine whether a problem exists with transistors in latches or with transistors in clock buffers. Broken points in the scan chain may then be determined based on the locations of unexpected light emission.

REFERENCES:
patent: 6490702 (2002-12-01), Song et al.
patent: 7010735 (2006-03-01), Motika et al.

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