Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Reexamination Certificate
2008-09-16
2008-09-16
Raymond, Edward (Department: 2857)
Data processing: measuring, calibrating, or testing
Testing system
Of circuit
C712S016000
Reexamination Certificate
active
10771218
ABSTRACT:
A mechanism for diagnosing broken scan chains based on leakage light emission is provided. An image capture mechanism detects light emission from leakage current in complementary metal oxide semiconductor (CMOS) devices. The diagnosis mechanism identifies devices with unexpected light emission. An unexpected amount of light emission may indicate that a transistor is turned off when it should be turned on or vice versa. All possible inputs may be tested to determine whether a problem exists with transistors in latches or with transistors in clock buffers. Broken points in the scan chain may then be determined based on the locations of unexpected light emission.
REFERENCES:
patent: 6490702 (2002-12-01), Song et al.
patent: 7010735 (2006-03-01), Motika et al.
Polonsky Stanislav V.
Song Peilin
Stellari Franco
Weger Alan J.
Xia Tian
Dang Thu Ann
Glanzman Gerald H.
International Business Machines - Corporation
Raymond Edward
Yee Duke W.
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