4. Optical: systems and elements
  5. Lens
  6. With reflecting element

Takuji Satoh

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Holographic interferometer

Optics: measuring and testing – By particle light scattering – With photocell detection
Patent

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Holographic interferometer

Optics: measuring and testing – By particle light scattering – With photocell detection
Patent

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Interferometer for measuring aspherical form with the utilizatio

Optics: measuring and testing – By particle light scattering – With photocell detection
Patent

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Scanning projection optical device

Optical: systems and elements – Deflection using a moving element
Patent

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Wide-field exposure optical system

Optical: systems and elements – Lens – With reflecting element
Patent

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Profile ID: LFUS-PAI-P-706474

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