Interferometer for measuring aspherical form with the utilizatio

Details Interferometer for measuring aspherical form with the utilizatio Interferometer for measuring aspherical form with the utilizatio

1989-07-10

1991-08-13

Turner, Samuel

Optics: measuring and testing

By particle light scattering

With photocell detection

356347, 356360, G01B 902

Patent

active

050392239

ABSTRACT:
An interferometer for measuring an aspherical shape uses a computer generated hologram. The interferometer comprises a hologram disposed at each of positions conjugate with plural types of aspherical surfaces to be examined and filed lens means disposed between a position conjugate with a convex aspherical surfaces and another position with a concave aspherical surface. The interferometer can measure plural types of aspherical surfaces to be examined without need of changing the position of the interferometer for each of the aspherical surfaces to be examined, even if the number of different surfaces to be examined increases.

REFERENCES:
patent: 4696572 (1987-09-01), Ono
patent: 4758089 (1988-07-01), Yokokura et al.

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