4. Electricity: measuring and testing
  5. Impedance, admittance or other quantities representative of...
  6. Distributive type parameters

Takashi Kobori

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Heat spreader and semiconductor device and package using the...

Active solid-state devices (e.g. – transistors – solid-state diode – Physical configuration of semiconductor – Mesa structure
Reexamination Certificate

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Method and apparatus for forming thin film

Chemistry: electrical and wave energy – Apparatus – Coating – forming or etching by sputtering
Reexamination Certificate

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Method of inspecting abnormality occurring inside pipe and appar

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Distributive type parameters
Patent

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Method of measuring inner diameter of pipe

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Distributive type parameters
Patent

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Semiconductor device and method for manufacturing...

Semiconductor device manufacturing: process – Semiconductor substrate dicing
Reexamination Certificate

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Profile ID: LFUS-PAI-P-1628421

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