Semiconductor device manufacturing: process – Semiconductor substrate dicing
Reexamination Certificate
2007-10-23
2007-10-23
Deo, Duy-Vu N (Department: 1765)
Semiconductor device manufacturing: process
Semiconductor substrate dicing
C438S461000, C438S462000, C438S463000, C438S464000
Reexamination Certificate
active
11328162
ABSTRACT:
A method for manufacturing a multilayered substrate for a semiconductor device, as well as a semiconductor device, is provided, the multilayered substrate exhibiting an excellent thermal conduction property and an excellent heat spreading effect without occurrence of warp and deformation. A diamond layer is formed through vapor phase deposition on one principal surface of a first silicon substrate by a CVD method. A SiO2layer is formed on this diamond layer. A SiO2layer is formed on a surface of a second silicon substrate by a thermal oxidation method. The diamond layer is bonded to the second silicon substrate with SiO2layers disposed on both the diamond layer and the second silicon substrate therebetween. The first silicon substrate is removed by dissolution through etching to expose the surface of the diamond layer. A silicon layer serving as a semiconductor layer is formed on the diamond layer by a CVD method.
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Hayashi Kazushi
Kobashi Koji
Kobori Takashi
Tachibana Takeshi
Yokota Yoshihiro
A. Marquez, Esq. Juan Carlos
Deo Duy-Vu N
Fisher Esq. Stanley P.
Kabushiki Kaisha Kobe Seiko Sho
Reed Smith LLP
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