4. Abrading
  5. Rigid tool
  6. Rotary cylinder

Takanori Ninomiya

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Apparatus and method for inspecting defects

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

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Apparatus and method for inspecting soldered portions

Optics: measuring and testing – Inspection of flaws or impurities – Having predetermined light transmission regions
Patent

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Apparatus and method for inspector defects

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

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Apparatus and method for testing defects

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

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Apparatus and method for testing defects

Semiconductor device manufacturing: process – With measuring or testing – Electrical characteristic sensed
Reexamination Certificate

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Profile ID: LFUS-PAI-P-766581

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